The MicroProf® profilometer is a powerful, multi-sensor capable tool for all your 2D and 3D surface analysis needs. These non-contact, optical profilers of the MicroProf® series are very versatile and modular measuring systems, from bench top to fully automated that can be used in R&D and on the production floor to enhance your product quality. The tools are offered in different sizes and with a wide range of point, line and field-of-view sensors to measure even the most challenging applications. No matter what you need to measure, whether profile, roughness, topography, TTV or film thickness, these systems are true all-rounders. The MicroProf® excels at measuring all surfaces, from super-smooth to very rough, matt or reflective with sub-nanometer precision. They are easy to use, very robust, future upgradable, and provide instant results for a time and cost efficient operation.
Besides the surface roughness these optical profilometers also measure the surface topography (profiles or area measurements) for the metrological determination of for example waviness, flatness, or step height. For non-contact and non-destructive characterization of thin, transparent or partially transparent layers and multi-layer systems, the MicroProf® profilometer series offers the ideal solution when equipped with a film thickness sensor (mainly reflectometry in various spectral and thickness ranges): Surface measuring equipment for optical film thickness measurement with the highest resolution and accuracy for layers with thicknesses of only a few nanometers to several millimeters.