Entry-level Profilometer for non-contact
optical 2D and 3D surface metrology

FRT MicroSpy^® Profile :
The new Optical Profilometer

Users in research and production trust in the new MicroSpy^® Profile for the measurement of specimen with many different surface characteristics from smooth to rough, matt to reflective or even transparent.

The measurement is performed with a new non-contact point sensor from FRT's CWL series. Due to a high performance and long-living LED as light source and the chromatic sensor principle with a measuring rate of 1kHz, even highly absorbing surfaces can be measured fast and reliably. The measuring principle of chromatic aberration offers high resolution down to the nanometer range is stable and virtually maintenance-free since no movable parts are used. There are sensor variations with different measuring ranges available to suite special applications and to deliver the perfect measurement solution for the given task.

A Notably Powerful Profilometer

The MicroSpy^® Profile is equipped with a motorized x,y- measuring range of 50 mm x 50 mm. The sensor is approached through a high-precision axis with manual coarse and fine adjustment. The optical pointsensor from FRT's CWL series is available with a height measuring range from 300 µm to 3 mm and a vertical resolution of up to 3 nm. In order to find the best solution for your measuring task, our FRT experts will support you extensively during the configuration of the system. Benefit from more than 13 years of experience in the area of surface metrology and analysis. Contact us, we look forward to meeting you.

Superior Service

FRT metrology experts support you with your measuring task and the system configuration that suits you best. FRT has more than 14 years of experience in the development and manufacturing of precise surface measuring tools such as an profilometer and offers extensive know-how in the analysis of surfaces and coatings. We look forward to support and consult you with your specific measuring task!

Perform many different measurements
with an optical profilometer such as:

• 3D-Topography
• Profile (e.g. in compliance with DIN EN ISO 4288)
• Roughness (e.g. DIN EN ISO 4287 / 4288)
• Step Height
• Planarity
• Geometry
• Volume
• Bearing Curve / Abbott Curve
• and much more
  
  
  

Notably User-Friendly

The new MicroSpy^® Profile is equipped with an optical point sensor for the surface measurement and an additional CCD-camera that creates a live video preview of the surface in the measuring software during sample positioning.

Set the measuring area easily with a few mouse clicks in the preview image and analyze the generated surface measurement data in the powerful software FRT Mark III.

Mark III is an industry proven software package for the analysis of 3D surface data gained from a profilometer. It offers a multitude of presentation, analysis and reporting functionalities and visualizes surfaces as 2D profiles and 3D topographies. Use various functions to analyze your surface in compliance with international metrology standards such as DIN, ISO, SEMI, ASTM or JIS and finally generate convincing reports on paper or as a PDF document. The also included data acquisition software FRT Acquire allows you to define and re-use measurement tasks (basic automation).

Notably Cost-Effective

The FRT MicroSpy^® Profile is designed as a powerful, yet cost-effective profilometer. This is reflected by its appealing purchase price as well as through low follow-up costs for training, service and spare parts. Its small footprint makes it the perfect addition to any lab and production environment.

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Download Profilometer Datasheet

Contact Information

Americas
FRT of America, LLC
Toll-Free: 1-866-FRT PROF
Email: info@frtofamerica.com
Internet: www.frtofamerica.com

Asia/Pacific
FRT Shanghai Co., Ltd.
Phone: +86 (0)21-5138-6260
Email: info@frt-china.cn
Internet: www.frt-china.cn

Europe
FRT, Fries Research & Technology GmbH
Phone: +49 (0)2204-84 2430
Email: info@frt-gmbh.com
Internet: www.frt-gmbh.com